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[n]	M. Sapinski and T. Kroyer, “Operational Limits of Wire Scanners on LHC Beam”, in Proc. BIW'08, Lake Tahoe, CA, USA, May 2008, paper TUPTPF066, pp. 274-278. 
[n]	A. Heuberger, “Lithography Production Techniques for next Generations of Microelectronics”, in Proc. EPAC'92, Berlin, Germany, Mar. 1992, pp. 192-197. 

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