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[n] J. A. Pellish, “Radiation Effects in Microelectronics - Why We Need Particle Accelerators”, presented at the NAPAC'22, Albuquerque, NM, USA, Aug. 2022, paper FRCDE3, unpublished.
[n] J. Biernat, “Modern electron beam diagnostic techniques based on LOCO and feed forward artificial neural networks.”, presented at the IPAC'24, Nashville, TN, USA, May 2024, paper TUPC59, unpublished.
[n] M. Pasquato and P. Sivera, “Software Integration and Test Techniques in a Large Distributed Project: Evolution, Process Improvement, Results”, in Proc. ICALEPCS'07, Oak Ridge, TN, USA, Oct. 2007, paper ROAB03, pp. 508-510.
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References
- J. A. Pellish, “Radiation Effects in Microelectronics - Why We Need Particle Accelerators”, presented at the North American Particle Accelerator Conf. (NAPAC'22), Albuquerque, NM, USA, Aug. 2022, paper FRCDE3, unpublished.
- J. Biernat, “Modern electron beam diagnostic techniques based on LOCO and feed forward artificial neural networks.”, presented at the 15th Int. Particle Accelerator Conf. (IPAC'24), Nashville, TN, USA, May 2024, paper TUPC59, unpublished.
- M. Pasquato and P. Sivera, “Software Integration and Test Techniques in a Large Distributed Project: Evolution, Process Improvement, Results”, in Proc. 11th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'07), Oak Ridge, TN, USA, Oct. 2007, paper ROAB03, pp. 508-510.
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