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[n]	J. A. Pellish, “Radiation Effects in Microelectronics - Why We Need Particle Accelerators”, presented at the NAPAC'22, Albuquerque, NM, USA, Aug. 2022, paper FRCDE3, unpublished. 
[n]	J. Biernat, “Modern electron beam diagnostic techniques based on LOCO and feed forward artificial neural networks.”, presented at the IPAC'24, Nashville, TN, USA, May 2024, paper TUPC59, unpublished. 
[n]	M. Pasquato and P. Sivera, “Software Integration and Test Techniques in a Large Distributed Project: Evolution, Process Improvement, Results”, in Proc. ICALEPCS'07, Oak Ridge, TN, USA, Oct. 2007, paper ROAB03, pp. 508-510. 

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